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ATEC-CONTAu-10 5X It also holds two FIB

SKU: 21473880728

4.6
EUR768.70 EUR791.70

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Ships within 48 hours · Estimated delivery Aug 3 - Aug 8

Description

It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging

Enables the use of Hitachi 15 and 25mm mounts with M4 thread on JEOL SEMs (including JEOL NEOSCOPE)

Roughness: Typically 2-3Å

*Uses average data measured for each production wafer

ATEC-CONTAu-10 5X It also holds two FIBDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating

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