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Ships within 48 hours · Estimated delivery Aug 3 - Aug 8
Not compatible with LFM SPMs
creep and cross-coupling effects
The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip
Pre-mounted on a 12mmmagnetic sample disk
NCHV-A nanoTA and STHM Samples Not compatible with LFM SPMs40N m, 320kHz, Al Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Silicon Probes. Quantity=10 Bruker's Value Line etched silicon probes for imaging in TappingMode and non contact mode in air, with reflective coating. This probe is also available without Aluminum reflex coating as model NCHV. Specifications: 40N m, 320kHz, Al Reflective Coating. Unmounted for use on any AFM. Tip Geometry: Standard (Steep)
